Nonvolatile memory device and method of operating fabricating the same

ABSTRACT

Provided is a method of reliably operating a highly integratable nonvolatile memory device. The nonvolatile memory device may include a string selection transistor, a plurality of memory transistors, and a ground selection transistor between a bit line and a common source line. In the nonvolatile memory device, data may be erased from the memory transistors by applying an erasing voltage to the bit line or the common source line.

PRIORITY STATEMENT

This application claims priority under 35 U.S.C. § 119 to Korean PatentApplication No. 10-2007-0058573, filed on Jun. 14, 2007, in the KoreanIntellectual Property Office, the disclosure of which is incorporatedherein in its entirety by reference.

BACKGROUND

Nonvolatile memory devices, e.g., electronically erasable programmableread only memories (EEPROMs) or flash memories may store data even whenpower is turned off, and further, stored data may be erased therefromand new data may be programmed thereto. Nonvolatile memory devices maybe used in semiconductor products, e.g., storage media for mobiledevices or portable memory sticks, etc.

Recently, with the trend toward smaller semiconductor products,nonvolatile memory devices used in the semiconductor products havebecome more highly integrated. For example, three-dimensionalnonvolatile memory devices may have a higher degree of integration in aplane compared to two-dimensional nonvolatile memory devices. Further,three-dimensional nonvolatile memory devices may be manufactured usingsilicon-on-insulator (SOI) substrates or nanowire structures.

In three-dimensional nonvolatile memory devices, a channel layer may notbe directly connected to a substrate. Thus, in three-dimensionalnonvolatile memory devices, it may be more difficult to erase data byapplying a body bias to a substrate, unlike in conventionaltwo-dimensional nonvolatile memory devices. In this regard, data may beerased by applying a negative voltage to a control gate electrode.However, this may lower the reliability of a tunneling insulating layer.

SUMMARY

Example embodiments provide a method of more reliably operating a morehighly integratable nonvolatile memory device.

According to example embodiments, there is provided a method ofoperating a nonvolatile memory device. The nonvolatile memory device mayinclude a string selection transistor, a plurality of memorytransistors, and/or a ground selection transistor between a bit line anda common source line. In the nonvolatile memory device, data may beerased from the memory transistors by applying an erasing voltage to abit line and/or a common source line.

According to example embodiments, in the erasing of data, a firsterasing voltage may be applied to the bit line and a second erasingvoltage may be applied to the common source line. The first erasingvoltage may be supplied from a high voltage pump via a row decoder andthe second erasing voltage may be supplied from the high voltage pumpvia a column decoder.

According to example embodiments, in the erasing of data, a pass voltagemay be applied to a gate of a string selection transistor and/or a gateof a ground selection transistor.

According to example embodiments, the nonvolatile memory device mayfurther include an auxiliary transistor between the string selectiontransistor and the bit line and/or between the ground selectiontransistor and the common source line, and in the erasing of data, afourth pass voltage may be further applied to the auxiliary transistor.

According to example embodiments, there may be provided a method ofoperating a nonvolatile memory device including a NAND cell arraybetween a plurality of bit lines and a common source line, the methodincluding simultaneously erasing data from the NAND cell array byapplying an erasing voltage to the plurality of bit lines and/or thecommon source line.

According to example embodiments, a nonvolatile memory device mayinclude a plurality of memory transistors, a bit line, and/or a commonsource line. The plurality of memory transistors may be between the bitline and the common source line. An erasing voltage may be applied to atleast one of the bit line and the common source line to erase data fromthe plurality of memory transistors. A string selection transistorand/or a ground selection transistor may also be included between thebit line and/or the common source line.

According to example embodiments, a method of fabricating a nonvolatilememory device may include forming a semiconductor layer, thesemiconductor layer including channel regions and source and drainregions, forming a plurality of control gate electrodes in or on thechannel regions; and/or interposing between the channel regions and thecontrol gate electrodes at least one of tunneling insulating layers,charge storage layers and blocking insulating layers.

BRIEF DESCRIPTION

The patent or application file contains at least one drawing executed incolor. Copies of this patent or patent application publication withcolor drawing will be provided by the Office upon request and payment ofthe necessary fee.

The above and other features and advantages will become more apparent bydescribing in detail example embodiments thereof with reference to theattached drawings in which:

FIG. 1 is a circuit diagram illustrating a layout of a nonvolatilememory device according to example embodiments;

FIG. 2 is a sectional view illustrating an example structure of anonvolatile memory device according to example embodiments;

FIG. 3 is a sectional view illustrating another example structure of anonvolatile memory device according to example embodiments;

FIG. 4 is a perspective view illustrating an example structure of anonvolatile memory device according to example embodiments;

FIGS. 5 through 7 are sectional views showing simulation results for thevoltage distribution of a nonvolatile memory device according to exampleembodiments;

FIGS. 8 through 11 are sectional views showing simulation results for anerasing operation of a nonvolatile memory device according to exampleembodiments; and

FIG. 12 is a block diagram illustrating a nonvolatile memory deviceaccording to example embodiments.

DETAILED DESCRIPTION

Example embodiments will now be described more fully with reference tothe accompanying drawings, in which example embodiments are shown.Example embodiments may, however, be embodied in many different formsand should not be construed as being limited to the example embodimentsset forth herein. Rather, example embodiments are provided so that thisdisclosure will be thorough and complete, and will fully convey thescope of the invention to one of ordinary skill in the art. In thedrawings, the sizes of constitutional elements may be exaggerated forthe convenience of illustration.

In example embodiments, rows and columns may be relatively designatedaccording to a viewing direction. Thus, rows and columns may beinterchanged.

Accordingly, while example embodiments are capable of variousmodifications and alternative forms, embodiments thereof are shown byway of example in the drawings and will herein be described in detail.It should be understood, however, that there is no intent to limitexample embodiments to the particular forms disclosed, but on thecontrary, example embodiments are to cover all modifications,equivalents, and alternatives falling within the scope of the invention.Like numbers refer to like elements throughout the description of thefigures.

It will be understood that, although the terms first, second, etc. maybe used herein to describe various elements, these elements should notbe limited by these terms. These terms are only used to distinguish oneelement from another. For example, a first element could be termed asecond element, and, similarly, a second element could be termed a firstelement, without departing from the scope of example embodiments. Asused herein, the term “and/or” includes any and all combinations of oneor more of the associated listed items.

It will be understood that when an element is referred to as being“connected” or “coupled” to another element, it can be directlyconnected or coupled to the other element or intervening elements may bepresent. In contrast, when an element is referred to as being “directlyconnected” or “directly coupled” to another element, there are nointervening elements present. Other words used to describe therelationship between elements should be interpreted in a like fashion(e.g., “between” versus “directly between”, “adjacent” versus “directlyadjacent”, etc.).

The terminology used herein is for the purpose of describing particularembodiments only and is not intended to be limiting of exampleembodiments. As used herein, the singular forms “a”, “an” and “the” areintended to include the plural forms as well, unless the context clearlyindicates otherwise. It will be further understood that the terms“comprises”, “comprising,”, “includes” and/or “including”, when usedherein, specify the presence of stated features, integers, steps,operations, elements, and/or components, but do not preclude thepresence or addition of one or more other features, integers, steps,operations, elements, components, and/or groups thereof.

It should also be noted that in some alternative implementations, thefunctions/acts noted may occur out of the order noted in the FIGS. Forexample, two FIGS. shown in succession may in fact be executedsubstantially concurrently or may sometimes be executed in the reverseorder, depending upon the functionality/acts involved.

Now, in order to more specifically describe example embodiments, variousembodiments will be described in detail with reference to the attacheddrawings. However, the present invention is not limited to exampleembodiments, but may be embodied in various forms. In the figures, if alayer is formed on another layer or a substrate, it means that the layeris directly formed on another layer or a substrate, or that a thirdlayer is interposed therebetween. In the following description, the samereference numerals denote the same elements.

FIG. 1 is a circuit diagram illustrating a layout of a nonvolatilememory device 100 according to example embodiments.

Referring to FIG. 1, the nonvolatile memory device 100 may have a NANDcell array. In the NAND cell array, a plurality of bit lines BL₀, BL₁ .. . BL_(m-1), BL_(m) may be arranged in columns, and a common sourceline CSL may be arranged in a row direction. A string selectiontransistor T_(SS), a plurality of memory transistors T_(M), and a groundselection transistor T_(GS) may be serially arranged between each of thebit lines BL₀, BL₁ . . . BL_(m-1), BL_(m), and the common source lineCSL.

A string selection line SSL may extend in a row direction so that thestring selection line SSL is connected to first gates G1 of stringselection transistors T_(SS). A ground selection line GSL may extend ina row direction so that the ground selection line GSL is connected tosecond gates G2 of ground selection transistors T_(GS). A plurality ofword lines WL0, WL1 . . . WL29, WL30, WL31 may extend in rows so thatthey are connected to control gates CG of the memory transistors T_(M).The number of the memory transistors T_(M) and the word lines WL0, WL1 .. . WL29, WL30, WL31 may vary and does not limit the scope of exampleembodiments.

Storage nodes SN of the memory transistors T_(M) may store data. Forexample, data may be programmed into the memory transistors T_(M) bystoring charges in the storage nodes SN through charge tunneling. For adata programming operation and a data reading operation, reference maybe made to a method of operating a conventional flash memory device.Hereinafter, a method of erasing data programmed in the memorytransistors T_(M) will be described.

In order to erase data from the memory transistors T_(M), a firsterasing voltage V_(ER1) may be applied to the bit lines BL₀, BL₁ . . .BL_(m-1), BL_(m), and a second erasing voltage V_(ER2) may be applied tothe common source line CSL. Furthermore, a first pass voltage V_(PS1)may be applied to the string selection line SSL, and/or a second passvoltage V_(PS2) may be applied to the ground selection line GSL. Thatis, the first pass voltage V_(PS1) may be applied to the first gates G1,and the second pass voltage V_(PS2) may be applied to the second gatesG2.

The first erasing voltage V_(ER1) and the second erasing voltage V_(ER2)may be sufficiently high voltages such that band-to-band tunneling isinduced between the memory transistors T_(M). The band-to-band tunnelingmay be induced by junction breakdown generated between sources anddrains of the memory transistors T_(M). For example, the first erasingvoltage V_(ER1) and the second erasing voltage V_(ER2) may be the same,e.g., 10 to 20 volts (V), for example 15V to 20V.

A channel width of the string selection transistor T_(SS) and the groundselection transistor T_(GS) may be greater than that of the memorytransistors T_(M). In example embodiments, the first erasing voltageV_(ER1) and the second erasing voltage V_(ER2) may be sufficiently high.If not, band-to-band tunneling may not occur in channels of the stringselection transistor T_(SS) and the ground selection transistor T_(GS).Thus, the first pass voltage V_(PS1) and the second pass voltage V_(PS2)may be selected so that the string selection transistor T_(SS) and theground selection transistor T_(GS) are turned on.

For example, the first pass voltage V_(PS1) and the second pass voltageV_(PS2) may be the same as or greater than the first erasing voltageV_(ER1) and the second erasing voltage V_(ER2). In example embodiments,the first pass voltage V_(PS1) may be greater than or the same as thesum of the first erasing voltage V_(ER1) and the threshold voltage ofthe string selection transistor T_(SS). Similarly, the second passvoltage V_(PS2) may be greater than or the same as the sum of the seconderasing voltage V_(ER2) and the threshold voltage of the groundselection transistor T_(GS).

After a predetermined or desired time period, holes may be injected intochannels of the memory transistors T_(M) through band-to-band tunneling.Thus, the channels of the memory transistors T_(M) may be charged with abalance voltage between the first erasing voltage V_(ER1) and the seconderasing voltage V_(ER2). For example, when the first erasing voltageV_(ER1) is the same as the second erasing voltage V_(ER2), the channelsof the memory transistors T_(M) may have an isoelectric potential.

Zero voltage may be applied to the word lines WL0, WL1 . . . WL29, WL30,WL31. Thus, 0 V may be applied to the control gates CG of the memorytransistors T_(M). Therefore, a high electric field may be inducedbetween the channels and the control gates CG of the memory transistorsT_(M), and electrons of the storage nodes SN may be moved to thechannels through tunneling. That is, data may be simultaneously erasedfrom the memory transistors T_(M). Meanwhile, band-to-band tunnelingbetween the channels may also be facilitated by applying a lower voltagethan the first erasing voltage V_(ER1) and the second erasing voltageV_(ER2) to the word lines WL0, WL1 . . . WL29, WL30, WL31.

According to example embodiments, a data erasing operation may beperformed even without applying a high voltage to the control gates CG.Thus, during a programming operation and an erasing operation,application of high voltages of opposite polarities to the control gatesCG may be avoided, thereby enhancing the reliability of the memorytransistors T_(M).

Example embodiments may be modified so that the first erasing voltageV_(ER1) may be applied to some of the bit lines BL₀, BL₁ . . . BL_(m-1),BL_(m), and 0 V may be applied to some of the word lines WL0, WL1 . . .WL29, WL30, WL31. By doing so, data may be selectively erased from onlysome of the memory transistors T_(M).

Example embodiments may also be modified so that only one of the firsterasing voltage V_(ER1) and the second erasing voltage V_(ER2) areapplied. For example, when the first erasing voltage V_(ER1) is appliedto the bit lines BL₀, BL₁ . . . BL_(m-1), BL_(m), the common source lineCSL may be in a floating state. As another example, when the seconderasing voltage V_(ER2) is applied to the common source line CSL, thebit lines BL₀, BL₁ . . . BL_(m-1), BL_(m) may be in a floating state. Inexample embodiments, however, a band-to-band tunneling efficiency may bereduced, and thus, the erasing speed of the memory transistors T_(M) maybe lower compared to when both the first erasing voltage V_(ER1) and thesecond erasing voltage V_(ER2) are applied.

In addition, example embodiments may be modified so that the first passvoltage V_(PS1) and/or the second pass voltage V_(PS2) are omittedbecause band-to-band tunneling may be induced in the channels of thestring selection transistor T_(SS) and the ground selection transistorT_(GS) by another method, e.g., by sufficiently increasing the firsterasing voltage V_(ER1) and the second erasing voltage V_(ER2) ordecreasing a channel width of the string selection transistor TSS andthe ground selection transistor T_(GS).

FIG. 2 is a sectional view illustrating an example structure of anonvolatile memory device 100 according to example embodiments. The bitline BL₀ of the nonvolatile memory device 100 of FIG. 1 is illustratedin FIG. 2.

Referring to FIG. 2, a semiconductor layer 105 may be provided. Thesemiconductor layer 105 may be formed (or otherwise disposed) in or on abulk substrate (not shown). For example, the semiconductor layer 105 mayhave a semiconductor thin film or a nanowire structure. In exampleembodiments, the semiconductor layer 105 may have a multi-layeredstructure. The semiconductor layer 105 may include channel regions 165and source and drain regions 160.

A plurality of control gate electrodes 140 may be disposed on thechannel regions 165. The control gate electrodes 140 may correspond tothe control gates CG of FIG. 1 and may constitute parts of the wordlines WL0, WL1 . . . WL29, WL30, WL31 of FIG. 1. Tunneling insulatinglayers 120, charge storage layers 125, and/or blocking insulating layers130 may be sequentially interposed between the channel regions 165 andthe control gate electrodes 140. The charge storage layers 125 maycorrespond to the storage nodes SN of FIG. 1.

A first gate electrode 115 may correspond to the first gate G1 of FIG. 1and may constitute a part of the string selection line SSL of FIG. 1. Afirst gate insulating layer 110 may be interposed between the first gateelectrode 115 and a channel region 165. A second gate electrode 150 maycorrespond to the second gate G2 of FIG. 1 and may constitute a part ofthe ground selection line GSL of FIG. 1. A second gate insulating layer145 may be interposed between the second gate electrode 150 and achannel region 165.

The source and drain regions 160 may be defined by doping impurities inportions of the semiconductor layer 105 between the first gate electrode115, the control gate electrodes 140, and the second gate electrode 150.The bit line BL₀ may be connected to an end of the semiconductor layer105, e.g., the source and drain region 160 of a string selectiontransistor (see T_(SS) of FIG. 1). A common source line CSL may beconnected to the other end of the semiconductor layer 105, e.g., thesource and drain region 160 of a ground selection transistor (see T_(GS)of FIG. 1).

Referring to FIG. 2, together with FIG. 1, when the first erasingvoltage V_(ER1) is applied to the bit line BL₀ and the second erasingvoltage V_(ER2) is applied to the common source line CSL, a strongreverse bias may be applied at the channel regions 165. Thus, junctionbreakdown may occur between the channel regions 165 and the source anddrain regions 160, thus generating band-to-band tunneling. Therefore,holes may be injected into the channel regions 165, and thus, asufficiently high voltage may be applied to the channel regions 165,thereby removing charges from the charge storage layers 125.

Alternatively, the source and drain regions 160 of the memorytransistors T_(M) may be defined in the semiconductor layer 105 by anelectric field effect, not by impurity doping. For example, the sourceand drain regions 160 may be defined by a side-fringing field of thefirst gate electrode 115, the control gate electrodes 140, and thesecond gate electrode 150. In example embodiments, before applying thefirst erasing voltage V_(ER1) and/or the second erasing voltage V_(ER2),a third pass voltage may be applied to the control gate electrodes 140or the word lines WL0, WL1 . . . WL29, WL30, WL31. Thus, before anerasing operation is performed, the source and drain regions 160 may beformed by a fringing field, and the channel regions 165 may be turnedon. After that, the erasing operation may be performed.

FIG. 3 is a sectional view illustrating a structure of a nonvolatilememory device 100 a according to example embodiments. The nonvolatilememory device 100 a may be manufactured by adding some constituents tothe nonvolatile memory device 100 of FIG. 2. Thus, portions of thedescription which overlap with example embodiment of FIG. 2 will beomitted.

Referring to FIG. 3, auxiliary gate electrodes 175 may be disposed onsource and drain regions 160 at both sides of a first gate electrode 115and/or source and drain regions 160 at both sides of a second gateelectrode 150. Auxiliary gate insulating layers 170 may be interposedbetween the source and drain regions 160 and the auxiliary gateelectrodes 175. The auxiliary gate electrodes 175 and the auxiliary gateinsulating layers 170 may form auxiliary transistors. The auxiliarytransistors may be coupled to sources or drains between a stringselection transistor (see T_(SS) of FIG. 1) and memory transistors (seeT_(M) of FIG. 1) and/or between a ground selection transistor (seeT_(GS) of FIG. 1) and the memory transistors T_(M).

The auxiliary gate electrodes 175 may be commonly connected to anauxiliary line SL. During an erasing operation of the nonvolatile memorydevice 100 a, a fourth pass voltage may be applied to the auxiliary lineSL. The fourth pass voltage may assist in facilitating band-to-bandtunneling in the string selection transistor T_(SS) and the groundselection transistor T_(GS). Therefore, the erasing speed of thenonvolatile memory device 100 a may be increased.

FIG. 4 is a perspective view illustrating a structure of a nonvolatilememory device 200 according to example embodiments. The nonvolatilememory device 200 may correspond to some of the memory transistors ofthe nonvolatile memory device 100 of FIG. 1.

Referring to FIG. 4, a plurality of nanowires 205 may be disposed on aninsulating layer 202. The nanowires 205 may correspond to thesemiconductor layer 105 of FIG. 2. A control gate electrode 240 may bedisposed on the insulating layer 202 to cover a plurality of surfaces ofthe nanowires 205. For example, the control gate electrode 240 maysurround three surfaces or all the surfaces of each of the nanowires205.

Such a structure may decreases area of memory transistors, therebycontributing to the higher integration of the nonvolatile memory device200. Moreover, an effective channel length may be increased, effectivelyreducing or preventing a short channel effect.

The erasing operations of FIGS. 1 through 3 may be applied to thenonvolatile memory device 200. That is, a body bias need not be appliedto the nonvolatile memory device 200, but a data erasing operation maybe performed using the erasing operation of FIG. 1, 2, or 3.Furthermore, the nonvolatile memory device 200 may be more highlyintegrated using a multi-stack structure, and data may be more reliablyerased with no body bias using the erasing operation of FIG. 1, 2, or 3.

FIGS. 5 through 7 are sectional views showing simulation results for thevoltage distribution of a nonvolatile memory device according to exampleembodiments. In this experimental example, a charge concentration(counts/cm³) increases.

Referring to FIG. 5, word lines WL0 . . . WL15 may be disposed on asemiconductor layer 305. The number of the word lines WL0 . . . WL15 wasoptionally selected for convenience of simulations. Thus, thenonvolatile memory device of this experimental example may correspond toa device obtained by reducing the number of the memory transistors fromthe nonvolatile memory device 100 of FIG. 1. Before an erasing operation(erasing time (t)=0 ns), memory transistors may be programmed to storedata, and the semiconductor layer 305 may be almost 0 V.

Referring to FIG. 6, an erasing voltage of about 10 V was applied to abit line BL, a common source line CSL, a string selection line SSL, anda ground selection line GSL, and 0 V was applied to the word lines WL0 .. . WL15. After an erasing time (t) of 10 ns, a voltage was propagatedfrom both ends of the semiconductor layer 305 to the middle. That is, avoltage increases from the bit line BL and the common source line CSL tothe middle.

Referring to FIG. 7, after an erasing time (t) of 100 ns, thesemiconductor layer 305 wholly reached about 10V. This shows that holeswere injected into the memory transistors through band-to-bandtunneling.

The simulation results of FIGS. 5 through 7 show that the erasingoperation of FIG. 1 may be efficiently performed. That is, an erasingvoltage may be supplied to the semiconductor layer 305 by applying theerasing voltage to the bit line BL and the common source line CSL.

FIGS. 8 through 11 are sectional views showing simulation results foranother erasing operation of a nonvolatile memory device according toexample embodiments. In this experimental example, a chargeconcentration (counts/cm³) decreases.

Referring to FIG. 8, a control gate electrode 340 may be provided on asemiconductor layer 305. A blocking insulating layer 330, a chargestorage layer 325, and a tunneling insulating layer 320 may be disposedbetween the control gate electrode 340 and the semiconductor layer 305.In this experimental example, the charge storage layer 325 served as atrapping layer, and an erasing voltage of about 20 V was applied to abit line and a common source line.

After an erasing time (t) of 10 ns, a charge concentration of the chargestorage layer 325 was not significantly changed. This shows that thepropagation of the erasing voltage may be not sufficient.

Referring to FIG. 9, after an erasing time (t) of 100 ns, a chargeconcentration was lowered at a bottom portion of the charge storagelayer 325. This shows that charges started to be removed from the chargestorage layer 325.

Referring to FIG. 10, after an erasing time (t) of 1 ms, a chargeconcentration was lowered at considerable portions of the charge storagelayer 325. This shows that a significant amount of charges were removedfrom the charge storage layer 325.

Referring to FIG. 11, after an erasing time (t) of 10 ms, a chargeconcentration was lowered at most of the charge storage layer 325. Thus,most charges were removed from the charge storage layer 325.

The results of FIGS. 8 through 11 show that an erasing operation may beperformed by applying an erasing voltage to a bit line and a commonsource line. Meanwhile, the charge storage layer 325 may also be formedas a floating gate, not as a trapping layer. In this case, an erasingspeed may be further increased.

FIG. 12 is a block diagram illustrating a nonvolatile memory device 400according to example embodiments.

Referring to FIG. 12, a NAND cell array 450 may correspond to thenonvolatile memory device 100 of FIG. 1. A string selection line SSL,word lines WL0, WL1 . . . WL29, WL30, WL31, a ground selection line GSL,and a common source line CSL of the NAND cell array 450 may be connectedto a row decoder 430. Bit lines BL of the NAND cell array 450 may beconnected to a page buffer 440 and a column decoder 435.

The row decoder 430 may receive signals through a SSL driver 425, a highvoltage pump 420, a high voltage ramp circuit 415, and a row pre-decoder410. Thus, during an erasing operation, a high erasing voltage may besupplied to the common source line CSL from the high voltage pump 420via the row decoder 430. A control logic 405 may optionally control theSSL driver 425, the high voltage pump 420, the high voltage ramp circuit415, and the row pre-decoder 410.

Unlike a conventional nonvolatile memory device, in example embodiments,the high voltage pump 420 may be further connected to the column decoder435. Thus, during an erasing operation, a high erasing voltage may besupplied to the bit lines BL from the high voltage pump 420 via thecolumn decoder 435. Therefore, the nonvolatile memory device 400 may notrequire an additional high voltage generator.

While example embodiments have been particularly shown and describedwith reference to FIGS. 1-12, it will be understood by those of ordinaryskill in the art that various changes in form and details may be madetherein without departing from the spirit and scope of exampleembodiments as defined by the following claims.

In a method of operating a nonvolatile memory device according toexample embodiments, an erasing operation may be reliably performedwithout applying a body bias. This operation method may be efficientlyapplied to a three-dimensional nonvolatile memory device to which a bodybias may not be applied. Such a three-dimensional nonvolatile memorydevice may be suitable for high integration and preventing a shortchannel effect.

Moreover, a data erasing operation may be performed even withoutapplying a high voltage to a control gate. Thus, during a programmingoperation and an erasing operation, application of high voltages ofopposite polarities to a control gate may be avoided, thereby enhancingthe reliability of memory transistors.

In addition, a high erasing voltage may be supplied to a row decoder anda column decoder using a single high voltage pump. Therefore, there maybe no need to use an additional high voltage generator.

1. A method of operating a nonvolatile memory device comprising: erasing data from a plurality of memory transistors by applying an erasing voltage to at least one of a bit line and a common source line, with the plurality of memory transistors being between the bit line and the common source line.
 2. The method of claim 1, wherein in the erasing of data, a first erasing voltage is applied to the bit line and a second erasing voltage is applied to the common source line.
 3. The method of claim 2, wherein the first erasing voltage and the second erasing voltage are the same.
 4. The method of claim 2, wherein each of the first erasing voltage and the second erasing voltage is between 10 and 20 volts.
 5. The method of claim 2, wherein the first erasing voltage is supplied from a high voltage pump via a row decoder, and the second erasing voltage is supplied from the high voltage pump via a column decoder.
 6. The method of claim 1, wherein in the erasing of data, a pass voltage is applied to at least one of a gate of a string selection transistor and a gate of a ground selection transistor between the bit line and the common source line.
 7. The method of claim 6, wherein a first pass voltage is applied to the gate of the string selection transistor and a second pass voltage is applied to the gate of the ground selection transistor.
 8. The method of claim 7, wherein the first pass voltage and the second pass voltage are the same as or greater than the erasing voltage.
 9. The method of claim 7, wherein the first pass voltage is greater than or the same as the sum of the erasing voltage and the threshold voltage of the string selection transistor.
 10. The method of claim 7, wherein the second pass voltage is greater than or the same as the sum of the erasing voltage and the threshold voltage of the ground selection transistor.
 11. The method of claim 1, wherein in the erasing of data, 0 volts is further applied to control gates of the memory transistors.
 12. The method of claim 7, wherein in the erasing of data, a third pass voltage is applied to control gates of the memory transistors, before applying the erasing voltage.
 13. The method of claim 12, wherein the nonvolatile memory device further includes an auxiliary transistor either between the string selection transistor and the bit line or between the ground selection transistor and the common source line, and wherein in the erasing of data, a fourth pass voltage is further applied to the auxiliary transistor.
 14. The method of claim 13, wherein the auxiliary transistor is coupled to a source or a drain of the string selection transistor or the ground selection transistor.
 15. A method of operating a nonvolatile memory device comprising: simultaneously erasing data from a NAND cell array by applying an erasing voltage to a plurality of bit lines or a common source line between the NAND cell array.
 16. The method of claim 15, wherein in the simultaneous erasing of data, a first erasing voltage is applied to the plurality of bit lines and a second erasing voltage is applied to the common source line.
 17. The method of claim 16, wherein the first erasing voltage and the second erasing voltage are the same.
 18. The method of claim 16, wherein the first erasing voltage is supplied from a high voltage pump via a row decoder, and the second erasing voltage is supplied from the high voltage pump via a column decoder.
 19. The method of claim 15, wherein in the simultaneous erasing of data, a pass voltage is applied to at least one of the string selection line and the ground selection line of the NAND cell array.
 20. The method of claim 19, wherein a first pass voltage is applied to the string selection line and a second pass voltage is applied to the ground selection line.
 21. A nonvolatile memory device comprising: a plurality of memory transistors; a bit line; and a common source line, the plurality of memory transistors being between the bit line and the common source line, with an erasing voltage being applied to at least one of the bit line and the common source line to erase data from the plurality of memory transistors.
 22. The device of claim 21, wherein a string selection transistor and a ground selection transistor are between the bit line and the common source line. 